cross-section transmission electronic microscopy image Search Results


crosssectional scanning electron microscopy image of our solar cells  (First Solar Inc)
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First Solar Inc crosssectional scanning electron microscopy image of our solar cells
Crosssectional Scanning Electron Microscopy Image Of Our Solar Cells, supplied by First Solar Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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backscattered electron microscopy cross-section image  (JEOL)
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JEOL backscattered electron microscopy cross-section image
Backscattered Electron Microscopy Cross Section Image, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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high-resolution scanning electron microscopy (hrsem) cross-section images  (Carl Zeiss)
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Carl Zeiss high-resolution scanning electron microscopy (hrsem) cross-section images
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
High Resolution Scanning Electron Microscopy (Hrsem) Cross Section Images, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional transmission electron microscopy tem philips/fei morgagni 268  (Philips Healthcare)
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Philips Healthcare cross-sectional transmission electron microscopy tem philips/fei morgagni 268
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
Cross Sectional Transmission Electron Microscopy Tem Philips/Fei Morgagni 268, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional transmission electron microscopy xtem  (Philips Healthcare)
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Philips Healthcare cross-sectional transmission electron microscopy xtem
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
Cross Sectional Transmission Electron Microscopy Xtem, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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h-9000uhr  (Hitachi Ltd)
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Hitachi Ltd h-9000uhr
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
H 9000uhr, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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transmission electron microscopy tem cross-section lamellae  (Carl Zeiss)
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Carl Zeiss transmission electron microscopy tem cross-section lamellae
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
Transmission Electron Microscopy Tem Cross Section Lamellae, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional transmission electron microscopy  (Sony)
90
Sony cross-sectional transmission electron microscopy
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
Cross Sectional Transmission Electron Microscopy, supplied by Sony, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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scanning electron microscopy images and cross sections  (Carl Zeiss)
90
Carl Zeiss scanning electron microscopy images and cross sections
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
Scanning Electron Microscopy Images And Cross Sections, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional transmission electron microscopy  (Opfermann Arzneimittel GMBH)
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Opfermann Arzneimittel GMBH cross-sectional transmission electron microscopy
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
Cross Sectional Transmission Electron Microscopy, supplied by Opfermann Arzneimittel GMBH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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crosssectional transmission electron microscopy philips tecnai 20  (Philips Healthcare)
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Philips Healthcare crosssectional transmission electron microscopy philips tecnai 20
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
Crosssectional Transmission Electron Microscopy Philips Tecnai 20, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross-sectional high-resolution transmission electron microscopy jem-ard1250  (JEOL)
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JEOL cross-sectional high-resolution transmission electron microscopy jem-ard1250
a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron <t>Microscopy</t> <t>(HRSEM)</t> images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.
Cross Sectional High Resolution Transmission Electron Microscopy Jem Ard1250, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron Microscopy (HRSEM) images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.

Journal: Nature Communications

Article Title: Ambipolar blend-based organic electrochemical transistors and inverters

doi: 10.1038/s41467-022-33264-2

Figure Lengend Snippet: a Out-of-plane XRD of pristine materials and the 95:5 w:w PrC 60 MA:p(g2T-TT) blend and the Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) measurement of the blend (inset). Dotted lines at 2 θ = 3.1° and 5.7° are associated with the (100) peaks of PrC 60 MA and p(g2T-TT), respectively. All other peaks are higher (h00) reflections of PrC 60 MA. b Scherrer analysis of the coherence length (L c ) of PrC 60 MA crystals in pristine and 95:5 blend films using a pseudo-voigt function fitting. In this analysis the FWHM of each (h00) reflection, \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${\triangle }_{q}$$\end{document} △ q , is plotted vs the square reflection order, m 2 , and the extrapolation to the 0 th order provides the L c , (Supplementary Fig. ). c Back-Scattered Electrons (BSE) detector cross-section High Resolution Scanning Electron Microscopy (HRSEM) images of the p(g2T-TT) (left), 95:5 blend (middle), and PrC 60 MA (right) films following a Vapor Phase Infiltration (VPI) ‘staining’ process. The bright contrast is due to nucleation and growth of ZnO particles. The distribution of ZnO particles throughout the blend film, in contrast to the pristine PrC 60 MA film, corroborates the bulk-heterojunction morphology. The scale bar is 200 nm.

Article Snippet: High-Resolution Scanning Electron Microscopy (HRSEM) cross-section images of films on Silicon substrates were recorded using a Zeiss Ultra-Plus FEG-SEM at 1.5 keV, with a Back-scattered Electrons (BSE) detector for Z-contrast observation between ZnO grains and unstained organic regions in the film.

Techniques: Electron Microscopy, Staining